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XJP-403J/403JT/403JA/403JAT

Industrial Metallurgical Microscope

This series microscope is widely used in observation & analysis of metallurgical organization in Mechanical industry, Research of Geological & Mineral department and viewing & measuring crystal, integrate circuit, micro-electronics, etc in Electronic industry. It is the first choice of Factories, Academy, Scientific research organization contrast image. Novel figure and superior craftsmanship keep abreast of the tidal current much more.Humanized configuration design and simple operation, Let you release from the pressure of heavy work.

Specifications

Specification                                 Model
XJP-403J XJP-403JT XJP-403JA XJP-403JAT
Viewing head   Compensation Free Binocular Head. Inclined    
  at 45 ° ( 50mm -75mm )
  Compensation Free Trinocular Head.    
  Inclined at 45 ° ( 50mm -75mm )
Eyepiece   WF10 × /20mm    
  WF10 ×/ 22mm    
  WF10 × /20mm with reticule 0.1mm
Nosepiece   Quadruple nosepiece    
  Quintuple nosepiece    
Objective   195 metallurgical 4 × /0.1W.D .25mm    
  objectives 10 ×/ 0.25W.D .11mm
  20 × /0.4W.D .9mm
  40 × /0.6W.D. 3.8mm
  Infinity metallurgical 4 × /0.1W.D .25mm    
  objectives 10 ×/ 0.25W.D .12mm
  20 × /0.4W.D .10mm
  40 × /0.6W.D. 7.1mm
  50 × /0.75W.D. 1.9mm 80 (S)× /0.9W.D. 0.9mm
Stage   Double layers mechanical stage
  Stage size: 242mm × 172mm
  Central stage: Φ110mm
  Moving range: 75mm × 50mm
Focusing   Coaxial coarse & fine focusing adjustment  with
  rack and pinion mechanism Fine focusing scale
  Value 0.002mm
Illumination   Epi-Kohler illumination. With aperture
  iris diaphragm and field iris diaphragm.
  12V/30W.AC85V-230V Adjustable brightness
Filter   Blue, green, yellow
Polarizing outfit   Analyzer rotatable 360 ° ,polarizer & Analyzer
  can be slided slided in / out of the optical path
Checking tool   0.01mm micrometer
Optional Accessory   1.3、2.0、3.0、5.0 Mega pixels CMOS electronic eyepiece
  Photography attachmrnt